Recombination lifetime measurements in silicon /

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Bibliographic Details
Other Authors: Gupta, Dinesh C., Bacher, Fred R., Hughes, William M.
Format: Book
Language:English
Published: West Conshohocken, PA : ASTM, c1998.
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Description
Item Description:Papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997.
"STP 1340."
Physical Description:392 p. : ill. ; 24 cm.
Bibliography:Includes bibliographical references and indexes.
ISBN:0803124899