Recombination lifetime measurements in silicon /

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Bibliographic Details
Other Authors:	Gupta, Dinesh C., Bacher, Fred R., Hughes, William M.
Format:	Book
Language:	English
Published:	West Conshohocken, PA : ASTM, c1998.
Subjects:	Semiconductors > Testing > Congresses. Service life (Engineering) > Forecasting > Congresses. Electronic measurements > Congresses.
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