Recombination lifetime measurements in silicon /
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| Άλλοι συγγραφείς: | , , |
|---|---|
| Μορφή: | Βιβλίο |
| Γλώσσα: | Αγγλικά |
| Έκδοση: |
West Conshohocken, PA :
ASTM,
c1998.
|
| Θέματα: | |
| Ετικέτες: |
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| 082 | 0 | 0 | |a 621.3815/2 |2 21 |
| 245 | 0 | 0 | |a Recombination lifetime measurements in silicon / |c Dinesh C. Gupta, Fred R. Bacher, and William M. Hughes, editors. |
| 260 | |a West Conshohocken, PA : |b ASTM, |c c1998. | ||
| 300 | |a 392 p. : |b ill. ; |c 24 cm. | ||
| 500 | |a Papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997. | ||
| 500 | |a "STP 1340." | ||
| 504 | |a Includes bibliographical references and indexes. | ||
| 541 | |e 6429 | ||
| 650 | 0 | |a Semiconductors |x Testing |x Congresses. | |
| 650 | 0 | |a Service life (Engineering) |x Forecasting |x Congresses. | |
| 650 | 0 | |a Electronic measurements |x Congresses. | |
| 700 | 1 | |a Gupta, Dinesh C. | |
| 700 | 1 | |a Bacher, Fred R. | |
| 700 | 1 | |a Hughes, William M. | |
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