Semiconductor material and device characterization /
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| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
[Piscataway, NJ] : Hoboken, N.J. :
IEEE Press ; Wiley,
c2006.
|
| Edition: | 3rd ed. |
| Subjects: | |
| Online Access: | Publisher description Table of contents only Contributor biographical information |
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| Item Description: | "Wiley-Interscience." |
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| Physical Description: | xv, 779 p. : ill. ; 25 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0471739065 (acidfree paper) 9780471739067 |