Semiconductor material and device characterization /
Guardat en:
| Autor principal: | |
|---|---|
| Format: | Llibre |
| Idioma: | anglès |
| Publicat: |
[Piscataway, NJ] : Hoboken, N.J. :
IEEE Press ; Wiley,
c2006.
|
| Edició: | 3rd ed. |
| Matèries: | |
| Accés en línia: | Publisher description Table of contents only Contributor biographical information |
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| 050 | 0 | 0 | |a QC611 |b .S335 2006 |
| 082 | 0 | 0 | |a 621.3815/2 |2 22 |
| 100 | 1 | |a Schroder, Dieter K. | |
| 245 | 1 | 0 | |a Semiconductor material and device characterization / |c Dieter K. Schroder. |
| 250 | |a 3rd ed. | ||
| 260 | |a [Piscataway, NJ] : |b IEEE Press ; |a Hoboken, N.J. : |b Wiley, |c c2006. | ||
| 300 | |a xv, 779 p. : |b ill. ; |c 25 cm. | ||
| 500 | |a "Wiley-Interscience." | ||
| 504 | |a Includes bibliographical references and index. | ||
| 541 | |e 35129 | ||
| 650 | 0 | |a Semiconductors. | |
| 650 | 0 | |a Semiconductors |x Testing. | |
| 856 | 4 | 2 | |3 Publisher description |u http://www.loc.gov/catdir/enhancements/fy0645/2005048514-d.html |
| 856 | 4 | 1 | |3 Table of contents only |u http://www.loc.gov/catdir/enhancements/fy0645/2005048514-t.html |
| 856 | 4 | 2 | |3 Contributor biographical information |u http://www.loc.gov/catdir/enhancements/fy0654/2005048514-b.html |
| 942 | |2 ddc |c TEXT | ||
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