Semiconductor material and device characterization /

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Bibliographic Details
Main Author:	Schroder, Dieter K.
Format:	Book
Language:	English
Published:	[Piscataway, NJ] : Hoboken, N.J. : IEEE Press ; Wiley, c2006.
Edition:	3rd ed.
Subjects:	Semiconductors. Semiconductors > Testing.
Online Access:	Publisher description Table of contents only Contributor biographical information
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