APA引文
Schroder, D. K. (2006). Semiconductor material and device characterization (3rd ed.). IEEE Press ; Wiley.
芝加哥风格引文
Schroder, Dieter K. Semiconductor Material and Device Characterization. 3rd ed. [Piscataway, NJ] : Hoboken, N.J.: IEEE Press ; Wiley, 2006.
MLA引文
Schroder, Dieter K. Semiconductor Material and Device Characterization. 3rd ed. IEEE Press ; Wiley, 2006.
警告：这些引文格式不一定是100％准确.