Cita APA (7th ed.)
Schroder, D. K. (2006). Semiconductor material and device characterization (3rd ed.). IEEE Press ; Wiley.
Cita Chicago (17th ed.)
Schroder, Dieter K. Semiconductor Material and Device Characterization. 3rd ed. [Piscataway, NJ] : Hoboken, N.J.: IEEE Press ; Wiley, 2006.
Cita MLA (9th ed.)
Schroder, Dieter K. Semiconductor Material and Device Characterization. 3rd ed. IEEE Press ; Wiley, 2006.
Atenció: Aquestes cites poden no estar 100% correctes.