Gupta, D. C., Bacher, F. R., & Hughes, W. M. (1998). Recombination lifetime measurements in silicon. ASTM.
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Chicago Style (17th ed.) Citation
Gupta, Dinesh C., Fred R. Bacher, and William M. Hughes. Recombination Lifetime Measurements in Silicon. West Conshohocken, PA: ASTM, 1998.
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MLA引文
Gupta, Dinesh C., et al. Recombination Lifetime Measurements in Silicon. ASTM, 1998.
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警告：這些引文格式不一定是100％准確.