APA-referens (7:e uppl.)
Afrin, F., Supervised by Lt Col Md. Aminul Islam, & Associate Professor, D. o. E. (2025). ENHANCED DETECTION AND ANOMALY IDENTIFICATION IN CHIPLESS RFID SYSTEMS USING SCALABLE MACHINE LEARNING MODELS. CSE DEPT MIST.
Chicago-referens (17:e uppl.)
Afrin, Farhana, Supervised by Lt Col Md. Aminul Islam, och Dept of EECE Associate Professor. ENHANCED DETECTION AND ANOMALY IDENTIFICATION IN CHIPLESS RFID SYSTEMS USING SCALABLE MACHINE LEARNING MODELS. Dhaka: CSE DEPT MIST, 2025.
MLA-referens (9:e uppl.)
Afrin, Farhana, et al. ENHANCED DETECTION AND ANOMALY IDENTIFICATION IN CHIPLESS RFID SYSTEMS USING SCALABLE MACHINE LEARNING MODELS. CSE DEPT MIST, 2025.
Varning: dessa hänvisningar är inte alltid fullständigt riktiga.