Delwedd Flaen

FAULT DIAGNOSIS OF DIFFERENTIAL AMPLIFIER ANALOG CIRCUITS USING BJT (ITC 97 BENCHMARK CIRCUITS) UTILIZING COMBINED EFFECT OF GAIN AND PHASE OF OUTPUT VOLTAGE WITH FREQUENCY /

Wedi'i Gadw mewn:
Prif Awdur: Rahman, Tasnim Ikra
Awdur Corfforaethol: Supervised by Hamidur Rahman (Professor, Electrical, Electronic and Communication Engineering, BUET, Dhaka.)
Awduron Eraill: Bushra Bente Khaai, Nishat Tasnim Liza
Fformat: Llyfr
Iaith:Saesneg
Cyhoeddwyd: Dhaka : EECE DEPT MIST , c 2015.
Pynciau:
Thesis Paper of EECE in B.Sc Prog.
Electrical, Electronic and Communication Engineering. >
Tagiau: Ychwanegu Tag
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!

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