Surface and thin film analysis : a compendium of principles, instrumentation, and applications /
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| Другие авторы: | , |
|---|---|
| Формат: | |
| Язык: | английский |
| Опубликовано: |
Weinheim :
Wiley-VCH,
c2011.
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| Редактирование: | 2nd, completely rev. and enlarged ed. |
| Предметы: | |
| Online-ссылка: | Contributor biographical information Publisher description Table of contents only |
| Метки: |
Нет меток, Требуется 1-ая метка записи!
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