Design of systems and circuits for maximum reliability or maximum production yield /

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Bibliographic Details
Main Author:	Becker, Peter W.
Other Authors:	Jensen, Finn, 1937- (joint author.)
Format:	Book
Language:	English
Published:	New York : McGraw-Hill, c1977.
Subjects:	Electronic circuit design > Data processing. Electronic systems > Design and construction > Data processing. Electronic apparatus and appliances > Reliability > Data processing.
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LEADER	00000nam a2200000 i 4500
001	24321
003	BD-DhMIS
005	20130916115530.0
008	130916s1977 ii a b 001 0 eng d
010			\|a 76017013
020			\|a 00700442306
040			\|a DLC \|c DLC \|d DLC \|d BD-DhMIS
050	0	0	\|a TK7867 \|b .B36 1977
082	0	0	\|a 621.3815/3/02854
100	1		\|a Becker, Peter W.
245	1	0	\|a Design of systems and circuits for maximum reliability or maximum production yield / \|c Peter W. Becker, Finn Jensen.
260			\|a New York : \|b McGraw-Hill, \|c c1977.
300			\|a xiv, 293 p. : \|b ill. ; \|c 24 cm.
504			\|a Includes bibliographical references (p. 281-289) and index.
541			\|e 24321
650		0	\|a Electronic circuit design \|x Data processing.
650		0	\|a Electronic systems \|x Design and construction \|x Data processing.
650		0	\|a Electronic apparatus and appliances \|x Reliability \|x Data processing.
700	1		\|a Jensen, Finn, \|d 1937- \|e joint author.
942			\|2 ddc \|c TEXT
952			\|0 0 \|1 0 \|2 ddc \|4 0 \|6 621_381530285400000_BEC \|7 0 \|9 16946 \|a MISTCL \|b MISTCL \|d 2013-09-16 \|e The Asia Foundation \|l 0 \|o 621.3815/3/02854 BEC \|p 3010024321 \|r 2013-09-16 00:00:00 \|t 1 \|w 2013-09-16 \|y TEXT
999			\|c 2110 \|d 2110