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Fault Detection and Localization of 8 bit Digital to Analog Converter Circuit

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dc.contributor.author Qucer Asha, Saima
dc.contributor.author Rahman, Naureen
dc.contributor.author Yasmin, Farzana
dc.date.accessioned 2015-12-01T04:53:18Z
dc.date.available 2015-12-01T04:53:18Z
dc.date.issued 2014-12
dc.identifier.uri http://hdl.handle.net/123456789/240
dc.description This work would not have been possible without the help and support of many individuals. We offer our sincerest gratitude to our supervisor, Associate Professor Hamidur Rahman, who has supported us throughout our research work with his patience and immense knowledge. We attribute the level of our Bachelor degree to his encouragement and effort and without him this thesis, too, would not have been completed. He taught us how to pursue research and gave us the much needed exposure and skill to think and give shape to our thoughts. He helped to shape the direction of this work and filled in many of the gaps in our knowledge. We are sincerely grateful to Capt M Mahbubur Rahman sir for his constant support, encouragement and cheerful applause for my accomplishments. We also want to thank Dept of EECE in MIST for financial assistance which was highly essential for our thesis. Lastly but not the least we would like to thank our parents for their moral support and encouragement en_US
dc.description.abstract With the advent of high performance (in terms of speed, power and area) digital circuits, the need for data converters with high accuracy for various kinds of applications, has attracted the attention of scientists and technologists all over the world. .The existing literature indicates that there is a need to have a very highly accurate circuit for data converters to achieve these goals. It is really difficult to achieve a fault free circuit with a huge number of components. In view of this, this thesis proposes a method which works efficiently in conjunction with gain waveforms of faulty & faults free Digital to Analog Converter (DAC) circuit as well as internal node voltages of two stage CMOS Operational Amplifier. We have developed an effective & efficient technique to detect & localize the fault. We have tested this technique on the DAC circuit & manipulated simulation result by Hspice and Matlab program. en_US
dc.description.sponsorship Department of Electrical, Electronics and Communication Engineering Military Institute of Science and Technology(MIST) en_US
dc.language.iso en en_US
dc.subject Fault Detection, Digital to Analog, Converter Circuit en_US
dc.title Fault Detection and Localization of 8 bit Digital to Analog Converter Circuit en_US
dc.type Other en_US


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